Name of Institution: Silesian University
Department: Faculty of Mathematics, Physics and Chemistry, Institute of Chemistry, Department of Analytical Chemistry
Address: Institute of Chemistry, Silesian University, ul. Szkolna 9, Katowice 40-006, Poland
Web site: -
Contact person:
                            Jerzy Jurczyk, Rafal Sitko
                            prof. dr Jerzy Jurczyk, dr Rafal Sitko
                            Phone: + 48 32 258 82 11 (extension phone 15 56)
                            Fax: + 48 32 259 99 78
                            e-mail: jurczyk@us.edu.pl, rsitko@us.edu.pl

Keywords: XRF, thin layer method, minerals, soil, mono- and polycrystals, PZT, ferroelectrics, environmental analysis,

Research profile:

• multielement XRF analysis of different materials with using wavelength-dispersive spectrometers (PW1410 and PW1450 Philips):
• determination of trace and minor elements in minerals and rocks
• analysis of microsamples of phosphors, multielement mono- and polycrystals (spinel structure) and ferroelectrics ceramic materials (lead titanate zirconate solid solution doped with different elements)
• environmental analysis of soils and plants; determination of trace elements
• working out methods of preparation of thin and intermediate samples for XRF analysis
• theoretical investigations of absorption and enhancement effects in thin, intermediate and thick samples

Domains of applications:

• analytical control of the synthesis and chemical composition (stoichiometry) of multielement mono- and polycrystals (spinel structure) and ferroelectrics ceramic materials
• determination of impurities in phosphors (during and after production cycle)
• evaluation of pollution of environment (heavy elements)